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electrostaticDeposition

Description

The electrostaticDeposition is a boundary condition to calculate electric potential (V) on a given boundary based on film thickness (h) and film resistance (R) fields which are updated based on a given patch-normal current density field (jn), Coulombic efficiency and film resistivity.

The governing equations are as follows:

jn=σpV=σ(n(V)p) j_n = - \sigma \nabla^\perp_p V = - \sigma (\vec{n}\cdot(\nabla V)_p) dhdt=Ceff(jnjmin) \frac{dh}{dt} = C_{eff} (j_n - j_{min}) dRdt=ρdhdt=ρCeff(jnjmin) \frac{dR}{dt} = \rho \frac{dh}{dt} = \rho C_{eff} (j_n - j_{min}) Vfilmn=Vfilmo+jnRΔ V_{film}^n = V_{film}^o + j_n R_\Delta Vbody=jnRbody V_{body} = j_n R_{body} Vpn=Vi+Vbody+Vfilmn V_p^n = V_i + V_{body} + V_{film}^n

where:

PropertyDescription
jnj_nPatch-normal current density [A/m^2]
VpnV_p^nElectric potential on film-fluid interface [volt = kg m^2/(A s^3)]
VpoV_p^oPrevious time-step electric potential on the interface [volt]
VfilmV_{film}Electric potential due to film resistance [volt]
VbodyV_{body}Electric potential due to body resistance [volt]
ViV_iInitial electric potential [volt]
RΔR_\DeltaFilm resistance (finite increment) [ohm m^2 = kg m^4/(A^2 s^3)]
RbodyR_{body}Body resistance [ohm m^2 = kg m^4/(A^2 s^3)]
ρ\rhoIsotropic film resistivity [ohm m = kg m^3/(A^2 s^3)]
hhFilm thickness [m]
CeffC_{eff}Volumetric Coulombic efficiency [m^3/(A s)]
jminj_{min}Minimum current density for deposition onset [A/m^2]
σ\sigmaIsotropic conductivity of mixture [S/m = A^2 s^3/(kg m^3)]
n\vec{n}Patch-normal unit vector [-]

Usage

The condition requires entries in both the boundary and field files.

Boundary file

<patchName>
{
type patch;
...
}

Field file

<patchName>
{
// Mandatory entries
type electrostaticDeposition;
h <scalarField>;
CoulombicEfficiency <PatchFunction1>;
resistivity <PatchFunction1>;

// Conditional mandatory entries

// Option-1: single-phase
sigma <scalar>;

// Option-2: multiphase
phases
{
alpha.air
{
sigma <scalar>;
}
alpha.water
{
sigma <scalar>;
}
alpha.mercury
{
sigma <scalar>;
}
...
}

// Optional entries
jMin <scalar>;
qMin <scalar>;
Rbody <scalar>;
Vi <scalar>;
Vanode <scalar>;
qCumulative <scalarField>;

// Inherited entries
...
}

where:

PropertyDescriptionTypeRequiredDefault
typeType name: electrostaticDepositionwordyes-
hFilm thicknessscalarFieldyes-
CoulombicEfficiencyCoulombic efficiencyPatchFunction1<scalar>yes-
resistivityIsotropic film resistivityPatchFunction1<scalar>yes-
sigmaIsotropic electrical conductivity of phasescalaryes-
jMinMinimum current density for deposition onsetscalarno0
qMinMinimum accumulative specific charge for deposition onsetscalarno0
RbodyResistance due to main body and/or pretreatment layersscalarno0
ViInitial electric potentialscalarno0
VanodeAnode electric potentialscalarnoGREAT
qCumulativeAccumulative specific charge [A s/m^2]scalarFieldno0

The inherited entries are elaborated in:

  • Depletion or abrasion of material due to negative current is not allowed.
  • When accumulative specific charge (qCumulative) is less than minimum accumulative specific charge (qMin), no deposition occurs.
  • Boundary-condition updates are not allowed during outer corrections to prevent spurious accumulation of film thickness.
  • resistivity, jMin, qMin and Rbody are always non-negative.

Further information

Tutorial:

Source code:

API:

History: Introduced in version v2112